DETERMINATION OF DIFFUSION PROFILES IN THIN FILM COUPLES BY MEANS OF X-RAY-DIFFRACTION.WAGENDRISTEL A.1975; APPL. PHYS.; GERM.; DA. 1975; VOL. 7; NO 3; PP. 175-179; BIBL. 22 REF.Article

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ANALYSE DER GESTALTAENDERUNG VON ALUMINIUMPULVERPARTIKELN WAEHREND EINES NASSMAHLVORGANGES = ANALYSE DU CHANGEMENT DE FORME DE PARTICULES DE POUDRES D'AL AU COURS DU BROYAGE A L'ETAT HUMIDEWAGENDRISTEL A; TSCHEGG E.1974; Z. NATURFORSCH., A; DTSCH.; DA. 1974; VOL. 29; NO 9; PP. 1325-1329; ABS. ANGL.; BIBL. 11 REF.Article

ROENTGENOGRAPHISCHE BESTIMMUNG DER KONZENTRATIONSVERTEILUNG INHOMOGENER LEGIERUNGEN = DETERMINATION DES PROFILS DE CONCENTRATION DANS LES ALLIAGES INHOMOGENES PAR DIFFRACTION DES RAYONS XWAGENDRISTEL A; WOLF D.1974; Z. METALLKDE; DTSCH.; DA. 1974; VOL. 65; NO 10; PP. 660-663; ABS. ANGL.; BIBL. 5 REF.Article

RECOVERY OF CONCENTRATION SPECTRA OF BINARY SOLIDS FROM DIFFRACTION PROFILES BY MEANS OF BAND MATRICESSCHATTSCHNEIDER P; WAGENDRISTEL A.1983; APPLIED PHYSICS. A, SOLIDS AND SURFACES; ISSN 0721-7250; DEU; DA. 1983; VOL. 31; NO 2; PP. 81-86; BIBL. 16 REF.Article

THE INFLUENCE OF THE GRAIN SHAPE ON X-RAY LINE BROADENINGSCHATTSCHNEIDER P; WAGENDRISTEL A.1980; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1980; VOL. 35; NO 9; PP. 960-963; BIBL. 3 REF.Article

THE INFLUENCE OF THE GRAIN SHAPE ON X-RAY LINE BROADENINGSCHATTSCHNEIDER P; WAGENDRISTEL A.1980; Z. NATURFORSCH., T. A, PHYS., PHYS. CHEM., KOSMOPHYS.; DEU; DA. 1980-09; VOL. 35; NO 9; PP. 960-963; BIBL. 3 REF.Article

SOME REMARKS ON THE EVALUATION OF CONCENTRATION SPECTRA IN SOLIDS FROM X-RAY DIFFRACTION PROFILES.SCHATTSCHNEIDER P; WAGENDRISTEL A.1975; Z. NATURFORSCH., A; DTSCH.; DA. 1975; VOL. 30; NO 10; PP. 1261-1264; BIBL. 8 REF.Article

X-RAY DIFFRACTION PROFILES OF INHOMOGENEOUS BINARY SOLIDS.SCHATTSCHNEIDER P; WAGENDRISTEL A.1978; Z. NATURFORSCH., A; DEU; DA. 1978; VOL. 33; NO 6; PP. 693-696; BIBL. 19 REF.Article

UEBER DIE TEMPERATURABHAENGIGKEIT DER DICHTE VON DUENNEN KUPFERAUFDAMPFSCHICHTEN. = SUR LA VARIATION THERMIQUE DE LA DENSITE DE COUCHES MINCES VAPORISEES DE CUIVREWAGENDRISTEL A; SOLLNER E.1975; Z. NATURFORSCH., A; DTSCH.; DA. 1975; VOL. 30; NO 1; PP. 44-47; ABS. ANGL.; BIBL. 18 REF.Article

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THE INFLUENCE OF GRAIN BOUNDARY MIGRATION ON THE DIFFUSION BEHAVIOUR OF THIN FILMSEHRMANN FALKENAU E; WAGENDRISTEL A.1980; Z. NATURFORSCH., A; ISSN 0340-4811; DEU; DA. 1980; VOL. 35; NO 6; PP. 613-618; BIBL. 28 REF.Article

ULTRAMICROHARDNESS TESTER FOR USE IN A SCANNING ELECTRON MICROSCOPEBANGERT H; WAGENDRISTEL A; ASCHINGER H et al.1981; COLLOID POLYM. SCI.; ISSN 0303-402X; DEU; DA. 1981; VOL. 259; NO 2; PP. 238-240; ABS. GERArticle

ULTRAMICROHARDNESS INVESTIGATIONS OF SINGLE CRYSTALS IN A SCANNING ELECTRON MICROSCOPE AND X-RAY TOPOGRAPHY OF THE DEFORMATION ZONE = ETUDE DE L'ULTRAMICRODURETE DE MONOCRISTAUX DANS UN MICROSCOPE ELECTRONIQUE A BALAYAGE ET TOPOGRAPHIE AUX RAYONS X DE LA ZONE DE DEFORMATIONBANGERT H; WAGENDRISTEL A; ASCHINGER H et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 89; NO 2; PP. 131Conference Paper

EXCITATION OF PLASMONS BY FAST ELECTRON IN THIN AMORPHOUS AND CRYSTALLINE AG-CU FILMS = EXCITATION DE PLASMONS PAR ELECTRONS RAPIDES DANS DES COUCHES MINCES AMORPHES ET CRISTALLINES DE AG-CUSCHATTSCHNEIDER P; REDA IM; WAGENDRISTEL A et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 90; NO 2; PP. 174Conference Paper

Ultralow-load hardness tester for use in a scanning electron microscopeBANGERT, H; WAGENDRISTEL, A.Review of scientific instruments. 1985, Vol 56, Num 8, pp 1568-1572, issn 0034-6748Article

DIFFRACTION PROFILES OF THIN FILM DIFFUSION COUPLESSEMERAD E; WAGENDRISTEL A; SCHATTSCHNEIDER P et al.1981; APPL. PHYS., A, SOLIDS SURF.; DEU; DA. 1981; VOL. 26; NO 4; PP. 247-253; BIBL. 15 REF.Article

LOW TEMPERATURE DIFFUSION IN THIN-FILM COUPLES OF POLYCRISTALLINE SILVER AND GOLDWAGENDRISTEL A; BANGERT H; KAZEROUNI KE et al.1978; APPL. PHYS.; DEU; DA. 1978; VOL. 17; NO 2; PP. 173-176; BIBL. 15 REF.Article

COMPUTER SIMULATION OF INTERDIFFUSION IN POLYCRYSTALLINE THIN FILM COUPLES.WAGENDRISTEL A; TSCHEGG E; SEMERAD E et al.1976; APPL. PHYS.; GERM.; DA. 1976; VOL. 10; NO 3; PP. 237-243; BIBL. 21 REF.Article

ELECTRON MICROSCOPE OBSERVATIONS OF INTERDIFFUSION AND ORDERING IN COPPER-GOLD THIN FILM DIFFUSION COUPLESWAGENDRISTEL A; BANGERT H; SEMERAD E et al.1975; THIN SOLID FILMS; NETHERL.; DA. 1975; VOL. 28; NO 2; PP. 337-344; BIBL. 9 REF.Article

AN X-RAY OPTICAL STUDY OF LAYERED PHASE GROWTH IN AU-AL THIN FILM COUPLES = ETUDE OPTIQUE RX DE LA CROISSANCE DE PHASE EN COUCHES DANS DES COUPLES DE COUCHES MINCES AU-ALWAGENDRISTEL A; SCHURZ H; EHRMANN FALKENAU E et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 9; PP. 4808-4812; BIBL. 19 REF.Article

Resistometric evidence of diffusional mixing in concentration layered amorphous AgCu films = Mise en évidence par résistométrie du mélange par diffusion de couches amorphes AgCu en couches de concentration différenteREDA, I. M; WAGENDRISTEL, A; BANGERT, H et al.Zeitschrift für Naturforschung. Teil A : Physik, physikalische Chemie, Kosmophysik. 1984, Vol 39, Num 6, pp 565-570, issn 0340-4811Article

AMORPHOUS CU-AG FILMS WITH HIGH STABILITYREDA IM; HAFNER J; PONGRATZ P et al.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 72; NO 1; PP. 313-324; ABS. GER; BIBL. 40 REF.Article

Atomic diffusion and structural relaxation in amorphous CuAg thin films = Diffusion atomique et relaxation structurale dans les couches minces amorphes CuAgREDA, I. M; WAGENDRISTEL, A; BANGERT, H et al.Journal of non-crystalline solids. 1984, Vol 61-62, pp 985-990, issn 0022-3093, 2Article